Workshop on Variability modelling and mitigation techniques in current and future technologies
(VAMM)
in conjunction with DATE 2012
Dresden, Germany - March 16, 2012
Technical Program

Room: TBD



8:15-8:30 Welcome & Opening Session: Antonio Rubio (UPC), Martin Elhøj (Nangate) and Jan van Gerwen (NXP)

8:30-10:00 Keynotes

  • "The Battle against Variability: the Designer Front", Yves Laplanche, ARM Ltd., UK

  • "Variability in emerging technologies", Asen Asenov, University of Glasgow, UK

10:00-10:30 Invited Talk (moderator: Antonio Rubio, UPC)

  • "SRAM scalability assessment in view of variability: a technology perspective", Miguel Miranda Corbalan, IMEC, BE

10:30-11:00 Coffee Break

11:00-12:00 Interactive Presentations: Variability at device level (chair: Francesc Moll, UPC)

  • "Variability and reliability of advanced MOSFETs: nanoscale characterization and circuit simulation", Montserrat Nafria, Rosana Rodriguez, Marc Porti, Javier Martin Martinez, Mario Lanza and Xavier Aymerich, Universitat Autonoma de Barcelona

  • "Impact of Proximity Effects on Variability of Deep nanoscale MOSFETs", Yangang Wang, Mark Zwolinski, University of Southampton, Andrew Appleby, Cambridge Silicon Radio LTD, and Philippe Hurat, Cadence Design Systems

  • "Statistical SPICE Models for High-Voltage LDMOS Transistors based TCAD Simulation", Alexander Steinmair, austriamicrosystemsAG, Johann Cervenka, Technical University of Vienna, Jong Mun Park and Ehrenfried Seebacher, austriamicrosystemsAG

  • "Methodology to Combat Channel Length litho-induced Variations at Layout Level", Sergio Gomez, Francesc Moll, Lancelot García-Leyva and Antonio Rubio, Univ. Politècnica de Catalunya

    12:00-13:00 Lunch

    13:00-13:30 Invited Talk (moderator: Jan van Gerwen, NXP)

    • "Variability Effects in MOSFET's operating in Sub-threshold region", Paolo Magnone, IUNET, U. Bologna, IT

    13:30-14:30 Interactive Presentations: Variability at circuit level (chair: André Reis, UFRGS)

  • "New Statistical Timing Analysis Method Considering Process Variations and Crosstalk", Qin Tang, Amir Zjajo, Michel Berkelaar and Nick Van Der Meijs, Delft University of Technology

  • "Process Variability-Aware Proactive Reconfiguration Technique for Mitigating Aging effects in Nano Scale SRAM lifetime", Peyman Pouyan, Esteve Amat and Antonio Rubio, Universitat Politècnica de Catalunya

  • "Ring Oscillator Structure for Performance Variability Evaluation and Monitoring of Flip-Flops", Renato Ribas, Kim Escobar, Alberto Wiltgen Jr., UFRGS, André Ivanov, UBC, and André Reis, UFRGS

  • " A new logic level delay modeling paradigm for nano-CMOS standard cells variation-aware simulation", Mauro Olivieri and Antonio Mastrandrea, DIET - Sapienza University of Rome

    14:30-15:00 Coffee Break

    15:00-16:00 Interactive Presentations: Variability at architecture level (chair: Fabrizio Ferrandi, PoliMi)

  • "ENERGY EFFICIENT AND RELIABLE WIRELESS SYSTEMS", Georgios Karakonstantis, EPFL, Christoph Roth, ETH, and Andreas Burg, EPFL

  • "Classification of variation maps: An efficient technique to combat process variation in FPGAs", Zhenyu Guan, Justin S. J. Wong, Sumanta Chaudhuri, George Constantinides and Peter Y. K. Cheung, Imperial College London

  • "A Reconfigurable Architecture for Current and Future Challenges in Electronic Design and Technology", James Alfred Walker, Martin Trefzer and Andy Tyrrell, University of York

  • "Improving Design Regularity by Targeting Custom Standard-Cell Libraries", Christian Pilato and Fabrizio Ferrandi, Politecnico di Milano

    16:00-17:00 Panel: A forward look on variability

    • Antonio Rubio, Univ. Politècnica de Catalunya, ES

    • Xavier Vera, Intel, ES

    • Asen Asenov, U. Glasgow/Gold Standard Simulations, UK

    • Nigel Woolaway, Leading Edge, IT

    • Martin Elhøj, Nangate, DK

    17:00 Close