Workshop on Variability modelling and mitigation techniques in current and future technologies
(VAMM)
in conjunction with DATE 2012
Dresden, Germany - March 16, 2012
Committees

Organizers

Antonio Rubio
Univ. Politècnica de Catalunya
Spain
Martin Elhøj
Nangate
Denmark
Jan van Gerwen
NXP Semiconductors
The Netherlands


Organizing Committee

Francesc Moll Echeto
Univ. Politècnica de Catalunya
Spain
Christian Pilato
Politecnico di Milano
Italy


Technical Program Committee

  • Asen Asenov, University of Glasgow, United Kingdom
  • Ramon Canal, Univ. Politècnica de Catalunya, Spain
  • Giuseppe Desoli, STMicroelectronics, Italy
  • Petr Dobrovolny, IMEC, Belgium
  • Martin Elhøj, Nangate, Denmark
  • Fabrizio Ferrandi, Politecnico di Milano, Italy
  • Jan van Gerwen, NXP Semiconductors, The Netherlands
  • Arnaud Grasset, THALES, France
  • Enrico Macii, Politecnico di Torino, Italy
  • Miguel Miranda Corbalan, IMEC, Belgium
  • Francesc Moll Echeto, Univ. Politècnica de Catalunya, Spain
  • Davide Pandini, STMicroelectronics, Italy
  • Paolo Pavan, Università degli Studi di Modena e Reggio Emilia, Italy
  • Christian Pilato, Politecnico di Milano, Italy
  • André I. Reis, UFRGS, Brazil
  • Renato P. Ribas, UFRGS, Brazil
  • Antonio Rubio, Univ. Politècnica de Catalunya, Spain
  • Enrico Sangiorgi, Università di Bologna, Italy
  • Loris Vendrame, Micron Technology, Italy
  • Xavier Vera, Intel, Spain
  • Nigel Woolaway, Leading Edge, Italy
  • Paul Zuber, IMEC, Belgium